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dc.contributor.authorFIGUEIREDO, Lucas Silva
dc.contributor.authorTEIXEIRA, João Marcelo Xavier Natário
dc.contributor.authorLIMA, João Paulo Silva do Monte
dc.contributor.authorOLIVEIRA, Maggi Lucas
dc.contributor.authorCHAVES, Thiago de Menezes
dc.contributor.authorSIMÕES, Francisco Paulo Magalhães
dc.contributor.authorALBUQUERQUE, Lucas Valença Rocha Martins de
dc.contributor.authorTEICHRIEB, Veronica
dc.contributor.authorCOSSIO, Lúcio Polese
dc.date.accessioned2025-03-18T15:44:42Z-
dc.date.available2025-03-18T15:44:42Z-
dc.date.issued2022-08-10
dc.date.submitted2018-12-20
dc.identifier.urihttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&CC=EP&NR=3899793A4
dc.identifier.urihttps://repositorio.ufpe.br/handle/123456789/61638-
dc.description.abstractAccording to examples, an apparatus may include a processor and a non-transitory computer readable medium on which is stored instructions that may cause the processor to create a 2D reference mesh for an image of a curved visual mark, establish correspondences between finder pattern points in the curved visual mark and points of the 2D reference mesh, and determine a curved 3D mesh having a radius that results in a minimal reprojection error of a projective transform estimated for correspondences between the 2D reference mesh and the curved 3D mesh while the radius remains below a predefined upper limit. The instructions may also cause the processor to sample components of the curved visual mark in elements of the determined curved 3D mesh to form a 2D planar image of the curved visual mark and analyze the 2D planar image of the curved visual mark to read the curved visual mark.
dc.language.isoeng
dc.publisherEuropean Patent Office (EPO)
dc.rightsAberto
dc.titleRead Curved Visual Marks
dc.typePatente
dc.publisher.countryEuropa
dc.identifier.patentnoEP 3899793
dc.contributor.institutionHewlett Packard Development Co
dc.contributor.institutionUniversidade Federal de Pernambuco
dc.relation.referencesEssa patente foi registrada no Instituto Nacional de Propriedade Industrial do Brasil (INPI) e no European Patent Office (EPO)
dc.ipcG06
Appears in Collections:Patentes

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